| .. |
|
.gitattributes
|
Git attributes for UNIX line endings (#17842)
|
4年前 |
|
ARMED-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
BIGTREE_BTT002-tests
|
Fix STM32 + SoftwareSerial compile (#17831)
|
4年前 |
|
BIGTREE_GTR_V1_0-tests
|
8 Extruders + Graphical LCD fix (#18079)
|
4年前 |
|
BIGTREE_SKR_PRO-tests
|
Fix BIGTREE_SKR_PRO tests
|
4年前 |
|
DUE-tests
|
Fix / optimize PCA9533 LED (Mightyboard) (#17381)
|
4年前 |
|
FLYF407ZG-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
FYSETC_F6_13-tests
|
Rename platform, part 2
|
4年前 |
|
FYSETC_S6-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
LPC1768-tests
|
SDCARD_READONLY (#17884)
|
4年前 |
|
LPC1769-tests
|
Fix LPC + EXPERIMENTAL_I2CBUS build error (#18040)
|
4年前 |
|
SAMD51_grandcentral_m4-tests
|
Add EXPERIMENTAL_SCURVE to AGC test
|
4年前 |
|
STM32F4-tests
|
Add more platform Travis tests
|
4年前 |
|
STM32F7-tests
|
Add more platform Travis tests
|
4年前 |
|
STM32F070RB_malyan-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
STM32F103CB_malyan-tests
|
Whitespace, M200 test label
|
4年前 |
|
STM32F103RC_btt-tests
|
Add TMC driver HW serial defines (#17909)
|
4年前 |
|
STM32F103RC_btt_USB-tests
|
Balance mega tests, shorten some env names
|
4年前 |
|
STM32F103RC_fysetc-tests
|
STM32F103.. reorganization, SKR mini fix (#15398)
|
4年前 |
|
STM32F103RC_meeb-tests
|
MEEB cleanup, whitespace
|
4年前 |
|
STM32F103RE-tests
|
STM32F103.. reorganization, SKR mini fix (#15398)
|
4年前 |
|
STM32F103RE_btt-tests
|
Add TMC driver HW serial defines (#17909)
|
4年前 |
|
STM32F103RE_btt_USB-tests
|
Balance mega tests, shorten some env names
|
4年前 |
|
STM32F103VE_longer-tests
|
STM32F103.. reorganization, SKR mini fix (#15398)
|
4年前 |
|
STM32F401VE_STEVAL-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
STM32F407VE_black-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
at90usb1286_cdc-tests
|
Add more platform Travis tests
|
4年前 |
|
at90usb1286_dfu-tests
|
Add more platform Travis tests
|
4年前 |
|
esp32-tests
|
Hotend Idle Timeout (#16362)
|
4年前 |
|
jgaurora_a5s_a1-tests
|
Add more platform Travis tests
|
4年前 |
|
linux_native-tests
|
Add more platform Travis tests
|
4年前 |
|
malyan_M300-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
mega1280-tests
|
Homing backoff enhancements
|
4年前 |
|
mega2560-tests
|
Fix test comments
|
4年前 |
|
mks_robin-tests
|
Add more platform Travis tests
|
4年前 |
|
mks_robin_lite-tests
|
STM32F1: SD EEPROM fallback (#17715)
|
4年前 |
|
mks_robin_mini-tests
|
Add more platform Travis tests
|
4年前 |
|
mks_robin_nano-tests
|
Add more platform Travis tests
|
4年前 |
|
mks_robin_pro-tests
|
Fix PID + Thermal Protection combos (#18023)
|
4年前 |
|
rambo-tests
|
Reorder RAMBo tests
|
4年前 |
|
rumba32_f446ve-tests
|
Improve and extend RUMBA32 (#18249)
|
4年前 |
|
rumba32_mks-tests
|
Normalize HAL/STM32 targets (#17904)
|
4年前 |
|
run_tests
|
More CI test updates
|
4年前 |
|
sanguino644p-tests
|
Balance mega tests, shorten some env names
|
4年前 |
|
sanguino1284p-tests
|
Balance mega tests, shorten some env names
|
4年前 |
|
teensy31-tests
|
Clean up HAL ADC, old test scripts
|
4年前 |
|
teensy35-tests
|
Non-SPI core homing pin tests (#17996)
|
4年前 |
Chris Barr